Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths.

infrared ellipsometry optical constants thermo-optic coefficient thin film vanadium sesquioxide

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
24 Apr 2020
Historique:
received: 13 02 2020
revised: 19 04 2020
accepted: 20 04 2020
entrez: 30 4 2020
pubmed: 30 4 2020
medline: 30 4 2020
Statut: epublish

Résumé

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (

Identifiants

DOI: 10.3390/ma13082002 PMID: 32344733 PMC: PMC7215483
pubmed: 32344733
pii: ma13082002
doi: 10.3390/ma13082002
pmc: PMC7215483
pii:
doi:

Types de publication

Journal Article

Langues

eng

Références

Opt Express. 2018 Jul 23;26(15):19479-19488
pubmed: 30114119

Auteurs

Mohamed Abdel-Rahman (M)

Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.
KACST-TIC in Radio Frequency and Photonics for the e-Society (RFTONICS), College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.
ORCID: 0000-0001-6132-0575

Esam Bahidra (E)

Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.
KACST-TIC in Radio Frequency and Photonics for the e-Society (RFTONICS), College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.

Ahmed Fauzi Abas (AF)

Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 11421, Saudi Arabia.

Classifications MeSH