Structural, Electronic and Magnetic Properties of a Few Nanometer-Thick Superconducting NdBa
resonant inelastic x-ray scattering
superconductivity
unit cell-thick films
Journal
Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216
Informations de publication
Date de publication:
24 Apr 2020
24 Apr 2020
Historique:
received:
30
03
2020
revised:
17
04
2020
accepted:
21
04
2020
entrez:
30
4
2020
pubmed:
30
4
2020
medline:
30
4
2020
Statut:
epublish
Résumé
Epitaxial films of high critical temperature ( T c ) cuprate superconductors preserve their transport properties even when their thickness is reduced to a few nanometers. However, when approaching the single crystalline unit cell (u.c.) of thickness, T c decreases and eventually, superconductivity is lost. Strain originating from the mismatch with the substrate, electronic reconstruction at the interface and alteration of the chemical composition and of doping can be the cause of such changes. Here, we use resonant inelastic x-ray scattering at the Cu L 3 edge to study the crystal field and spin excitations of NdBa 2 Cu 3 O 7 - x ultrathin films grown on SrTiO 3 , comparing 1, 2 and 80 u.c.-thick samples. We find that even at extremely low thicknesses, the strength of the in-plane superexchange interaction is mostly preserved, with just a slight decrease in the 1 u.c. with respect to the 80 u.c.-thick sample. We also observe spectroscopic signatures for a decrease of the hole-doping at low thickness, consistent with the expansion of the
Identifiants
pubmed: 32344792
pii: nano10040817
doi: 10.3390/nano10040817
pmc: PMC7221900
pii:
doi:
Types de publication
Journal Article
Langues
eng
Subventions
Organisme : Ministero dell'Istruzione, dell'Università e della Ricerca
ID : 2017Z8TS5B
Organisme : Horizon 2020 Framework Programme
ID : 823717 - ESTEEM3
Organisme : Paul Scherrer Institut
ID : ADRESS beam line
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