Supported Ultra-Thin Alumina Membranes with Graphene as Efficient Interference Enhanced Raman Scattering Platforms for Sensing.

AFM SEM alumina membrane enhanced Raman scattering graphene interference nanoparticles optical simulations

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
27 Apr 2020
Historique:
received: 06 04 2020
revised: 22 04 2020
accepted: 23 04 2020
entrez: 1 5 2020
pubmed: 1 5 2020
medline: 1 5 2020
Statut: epublish

Résumé

The detection of Raman signals from diluted molecules or biomaterials in complex media is still a challenge. Besides the widely studied Raman enhancement by nanoparticle plasmons, interference mechanisms provide an interesting option. A novel approach for amplification platforms based on supported thin alumina membranes was designed and fabricated to optimize the interference processes. The dielectric layer is the extremely thin alumina membrane itself and, its metallic aluminum support, the reflecting medium. A CVD (chemical vapor deposition) single-layer graphene is transferred on the membrane to serve as substrate to deposit the analyte. Experimental results and simulations of the interference processes were employed to determine the relevant parameters of the structure to optimize the Raman enhancement factor (E.F.). Highly homogeneous E.F. over the platform surface are obtained, typically 370 ± (5%), for membranes with ~100 nm pore depth, ~18 nm pore diameter and the complete elimination of the Al

Identifiants

pubmed: 32349274
pii: nano10050830
doi: 10.3390/nano10050830
pmc: PMC7712178
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Ministerio de Ciencia e Innovación
ID : RTI2018-096918-B-C41
Organisme : Ministerio de Ciencia e Innovación
ID : RTI2018-094040-B-I00
Organisme : Ministerio de Ciencia e Innovación
ID : BES-2016-076440

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Auteurs

Montserrat Aguilar-Pujol (M)

Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas Cantoblanco, 28049 Madrid, Spain.

Rafael Ramírez-Jiménez (R)

Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas Cantoblanco, 28049 Madrid, Spain.
Departamento de Física, Escuela Politécnica Superior, Universidad Carlos III de Madrid, Avenida Universidad 30, Leganés, 28911 Madrid, Spain.

Elisabet Xifre-Perez (E)

Department of Electronic Engineering, Universitat Rovira i Virgili, Avda. Països Catalans 26, 43007 Tarragona, Spain.

Sandra Cortijo-Campos (S)

Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas Cantoblanco, 28049 Madrid, Spain.

Javier Bartolomé (J)

Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas Cantoblanco, 28049 Madrid, Spain.
Departamento de Física de Materiales, Universidad Complutense de Madrid, Plaza Ciencias 1, 28040 Madrid, Spain.

Lluis F Marsal (LF)

Department of Electronic Engineering, Universitat Rovira i Virgili, Avda. Països Catalans 26, 43007 Tarragona, Spain.

Alicia de Andrés (A)

Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas Cantoblanco, 28049 Madrid, Spain.

Classifications MeSH