High-speed femtosecond laser plasmonic lithography and reduction of graphene oxide for anisotropic photoresponse.

Nanophotonics and plasmonics Ultrafast lasers

Journal

Light, science & applications
ISSN: 2047-7538
Titre abrégé: Light Sci Appl
Pays: England
ID NLM: 101610753

Informations de publication

Date de publication:
2020
Historique:
received: 16 12 2019
revised: 01 04 2020
accepted: 07 04 2020
entrez: 1 5 2020
pubmed: 1 5 2020
medline: 1 5 2020
Statut: epublish

Résumé

Micro/nanoprocessing of graphene surfaces has attracted significant interest for both science and applications due to its effective modulation of material properties, which, however, is usually restricted by the disadvantages of the current fabrication methods. Here, by exploiting cylindrical focusing of a femtosecond laser on graphene oxide (GO) films, we successfully produce uniform subwavelength grating structures at high speed along with a simultaneous in situ photoreduction process. Strikingly, the well-defined structures feature orientations parallel to the laser polarization and significant robustness against distinct perturbations. The proposed model and simulations reveal that the structure formation is based on the transverse electric (TE) surface plasmons triggered by the gradient reduction of the GO film from its surface to the interior, which eventually results in interference intensity fringes and spatially periodic interactions. Further experiments prove that such a regular structured surface can cause enhanced optical absorption (>20%) and an anisotropic photoresponse (~0.46 ratio) for the reduced GO film. Our work not only provides new insights into understanding the laser-GO interaction but also lays a solid foundation for practical usage of femtosecond laser plasmonic lithography, with the prospect of expansion to other two-dimensional materials for novel device applications.

Identifiants

pubmed: 32351693
doi: 10.1038/s41377-020-0311-2
pii: 311
pmc: PMC7183510
doi:

Types de publication

Journal Article

Langues

eng

Pagination

69

Informations de copyright

© The Author(s) 2020.

Déclaration de conflit d'intérêts

Conflict of interestThe authors declare that they have no conflict of interest.

Références

Opt Express. 2008 Aug 18;16(17):13354-63
pubmed: 18711573
Small. 2010 Mar 22;6(6):711-23
pubmed: 20225186
Adv Mater. 2018 Jan;30(2):
pubmed: 29168903
Nat Commun. 2013;4:2560
pubmed: 24091384
Light Sci Appl. 2017 Dec 15;6(12):e17112
pubmed: 30167223
ACS Nano. 2012 Sep 25;6(9):7806-13
pubmed: 22862147
Nat Photonics. 2017 Oct;11(10):639-645
pubmed: 28983323
Nat Commun. 2015 Sep 22;6:8433
pubmed: 26391504
Adv Mater. 2015 Apr 24;27(16):2595-601
pubmed: 25771787
Adv Mater. 2017 Oct;29(38):
pubmed: 28833544
Nat Nanotechnol. 2011 Sep 04;6(10):630-4
pubmed: 21892164
Opt Express. 2014 Feb 24;22(4):4714-22
pubmed: 24663790
Chem Rev. 2016 May 11;116(9):5464-519
pubmed: 27033639
Nat Commun. 2014 Dec 10;5:5714
pubmed: 25493446
ACS Nano. 2012 Feb 28;6(2):1395-403
pubmed: 22242925
Nat Nanotechnol. 2014 Aug;9(8):577-87
pubmed: 25091447
Proc Natl Acad Sci U S A. 2005 Jul 26;102(30):10439-44
pubmed: 16020537
ACS Nano. 2009 Dec 22;3(12):4062-70
pubmed: 20025303
Nano Lett. 2014 Jun 11;14(6):3214-9
pubmed: 24801736
ACS Nano. 2017 May 23;11(5):5031-5040
pubmed: 28471649
Nat Commun. 2013;4:1452
pubmed: 23385596
Adv Mater. 2011 Dec 1;23(45):5419-24
pubmed: 21786342
Sci Rep. 2017 Aug 16;7(1):8485
pubmed: 28814773

Auteurs

Tingting Zou (T)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049 Beijing, China.

Bo Zhao (B)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
3Department of Electronic Information and Physics, Changzhi University, 046011 Changzhi, China.

Wei Xin (W)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.

Ye Wang (Y)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049 Beijing, China.

Bin Wang (B)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049 Beijing, China.

Xin Zheng (X)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049 Beijing, China.

Hongbo Xie (H)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, 100049 Beijing, China.

Zhiyu Zhang (Z)

4Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP), Chinese Academy of Sciences (CAS), 130033 Changchun, China.

Jianjun Yang (J)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.

Chun-Lei Guo (CL)

1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 130033 Changchun, China.
5The Institute of Optics, University of Rochester, Rochester, NY 14627 USA.

Classifications MeSH