Determination of Electron Band Structure using Temporal Interferometry.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
17 Apr 2020
Historique:
revised: 14 08 2019
received: 11 06 2019
accepted: 31 03 2020
entrez: 2 5 2020
pubmed: 2 5 2020
medline: 2 5 2020
Statut: ppublish

Résumé

We propose an all-optical method to directly reconstruct the band structure of semiconductors. Our scheme is based on the temporal Young's interferometer realized by high harmonic generation with a few-cycle laser pulse. As a time-energy domain interferometer, temporal interference encodes the band structure into the fringe in the energy domain. The relation between the band structure and the emitted harmonic frequencies is established. This enables us to retrieve the band structure from the spectrum of high harmonic generation with a single-shot measurement. Our scheme paves the way to study matters under ambient conditions and to track the ultrafast modification of band structures.

Identifiants

pubmed: 32357017
doi: 10.1103/PhysRevLett.124.157403
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

157403

Auteurs

Liang Li (L)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

Pengfei Lan (P)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

Lixin He (L)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

Wei Cao (W)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

Qingbin Zhang (Q)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

Peixiang Lu (P)

Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.
Hubei Key Laboratory of Optical Information and Pattern Recognition, Wuhan Institute of Technology, Wuhan 430205, China.
CAS Center for Excellence in Ultraintense Laser Science, Shanghai 201800, China.

Classifications MeSH