X-ray characterization of the Icarus ultrafast x-ray imager.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Apr 2020
Historique:
entrez: 3 5 2020
pubmed: 3 5 2020
medline: 3 5 2020
Statut: ppublish

Résumé

Ultrafast x-ray imagers developed at Sandia National Laboratories are a transformative diagnostic tool in inertial confinement fusion and high energy density physics experiments. The nanosecond time scales on which these devices operate are a regime with little precedent, and applicable characterization procedures are still developing. This paper presents pulsed x-ray characterization of the Icarus imager under a variety of illumination levels and timing modes. Results are presented for linearity of response, absolute sensitivity, variation of response with gate width, and image quality.

Identifiants

pubmed: 32357690
doi: 10.1063/5.0004711
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

043502

Auteurs

Quinn Looker (Q)

Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.

Anthony P Colombo (AP)

Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.

Mark Kimmel (M)

Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.

John L Porter (JL)

Sandia National Laboratories, Albuquerque, New Mexico 87123, USA.

Classifications MeSH