Wafer-scale 2D PtTe


Journal

Nanoscale
ISSN: 2040-3372
Titre abrégé: Nanoscale
Pays: England
ID NLM: 101525249

Informations de publication

Date de publication:
21 May 2020
Historique:
pubmed: 7 5 2020
medline: 7 5 2020
entrez: 7 5 2020
Statut: ppublish

Résumé

Two-dimensional (2D) transition metal dichalcogenide (TMD) layers have gained increasing attention for a variety of emerging electrical, thermal, and optical applications. Recently developed metallic 2D TMD layers have been projected to exhibit unique attributes unattainable in their semiconducting counterparts; e.g., much higher electrical and thermal conductivities coupled with mechanical flexibility. In this work, we explored 2D platinum ditelluride (2D PtTe2) layers - a relatively new class of metallic 2D TMDs - by studying their previously unexplored electro-thermal properties for unconventional window applications. We prepared wafer-scale 2D PtTe2 layer-coated optically transparent and mechanically flexible willow glasses via a thermally-assisted tellurization of Pt films at a low temperature of 400 °C. The 2D PtTe2 layer-coated windows exhibited a thickness-dependent optical transparency and electrical conductivity of >106 S m-1 - higher than most of the previously explored 2D TMDs. Upon the application of electrical bias, these windows displayed a significant increase in temperature driven by Joule heating as confirmed by the infrared (IR) imaging characterization. Such superior electro-thermal conversion efficiencies inherent to 2D PtTe2 layers were utilized to demonstrate various applications, including thermochromic displays and electrically-driven defogging windows accompanying mechanical flexibility. Comparisons of these performances confirm the superiority of the wafer-scale 2D PtTe2 layers over other nanomaterials explored for such applications.

Identifiants

pubmed: 32373894
doi: 10.1039/d0nr01845g
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

10647-10655

Auteurs

Emmanuel Okogbue (E)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu and Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida 32816, USA.

Tae-Jun Ko (TJ)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu.

Sang Sub Han (SS)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu and Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, South Korea.

Mashiyat Sumaiya Shawkat (MS)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu and Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida 32816, USA.

Mengjing Wang (M)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu.

Hee-Suk Chung (HS)

Analytical Research Division, Korea Basic Science Institute, Jeonju 54907, South Korea.

Kyu Hwan Oh (KH)

Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, South Korea.

Yeonwoong Jung (Y)

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. yeonwoong.jung@ucf.edu and Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida 32816, USA and Department of Materials Science and Engineering, University of Central Florida, Orlando, Florida 32826, USA.

Classifications MeSH