Neutral attenuating pinhole for x-ray imaging of high-intensity sources.
Journal
Applied optics
ISSN: 1539-4522
Titre abrégé: Appl Opt
Pays: United States
ID NLM: 0247660
Informations de publication
Date de publication:
01 Apr 2020
01 Apr 2020
Historique:
entrez:
14
5
2020
pubmed:
14
5
2020
medline:
14
5
2020
Statut:
ppublish
Résumé
Pinhole imagers are common x-ray diagnostics in high energy density physics experiments, where temperatures exceeding 10
Identifiants
pubmed: 32400600
pii: 429501
doi: 10.1364/AO.386906
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM