Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST).
Animals
Automation
/ methods
Brain
/ cytology
Computed Tomography Angiography
/ methods
Histological Techniques
/ methods
Image Processing, Computer-Assisted
/ methods
Imaging, Three-Dimensional
/ methods
Ions
/ chemistry
Liver
/ cytology
Materials Science
/ methods
Mice
Microscopy, Electron, Scanning
/ methods
Microtomy
/ methods
Biological Tissues
Computed tomography (CT)
Geology
Medical
Metallurgy
Serial block-face scanning electron microscopy (SBEM)
Journal
Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702
Informations de publication
Date de publication:
07 2020
07 2020
Historique:
received:
11
06
2019
revised:
13
03
2020
accepted:
28
03
2020
pubmed:
18
5
2020
medline:
8
7
2021
entrez:
17
5
2020
Statut:
ppublish
Résumé
Here we describe the first automated fully integrated in-microscope broad ion beam (BIB) system. Ar
Identifiants
pubmed: 32416435
pii: S0304-3991(19)30209-8
doi: 10.1016/j.ultramic.2020.112989
pii:
doi:
Substances chimiques
Ions
0
Types de publication
Journal Article
Research Support, Non-U.S. Gov't
Langues
eng
Sous-ensembles de citation
IM
Pagination
112989Informations de copyright
Copyright © 2020 The Authors. Published by Elsevier B.V. All rights reserved.
Déclaration de conflit d'intérêts
Declaration of Competing Interest None.