Gate Spacer Investigation for Improving the Speed of High-Frequency Carbon Nanotube-Based Field-Effect Transistors.

Schottky barrier asymmetric FET buried gate carbon nanotube-based field-effect transistor electrostatic control gate spacer high frequency

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
17 Jun 2020
Historique:
pubmed: 22 5 2020
medline: 22 5 2020
entrez: 22 5 2020
Statut: ppublish

Résumé

Carbon nanotube (CNT)-based field-effect transistors have demonstrated great potential for high-frequency (HF) analog transceiver electronics. Despite significant advancements, one of the remaining challenges is the optimization of the device architecture for obtaining the highest possible speed and linearity. While most studies so far have concentrated on symmetrical top gated FET devices, we report on the impact of the device architecture on their HF performance. Based on a wafer-level nanotechnology platform and device simulations, transistors with a buried gate having different widths and positions in the FET channel have been fabricated. Analysis of several FETs with nonsymmetrical gate electrode location in the channel revealed a speed increase of up to 18% measured by the external transit frequency

Identifiants

pubmed: 32436374
doi: 10.1021/acsami.0c01171
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

27461-27466

Auteurs

Martin Hartmann (M)

Center for Microtechnologies, Chemnitz University of Technology, Chemnitz, Sachsen 09126, Germany.
Center for Advancing Electronics Dresden CFAED, Dresden, Saxony 01062, Germany.

Jana Tittmann-Otto (J)

Center for Microtechnologies, Chemnitz University of Technology, Chemnitz, Sachsen 09126, Germany.
Center for Advancing Electronics Dresden CFAED, Dresden, Saxony 01062, Germany.

Simon Böttger (S)

Center for Microtechnologies, Chemnitz University of Technology, Chemnitz, Sachsen 09126, Germany.

Georg Heldt (G)

Department Back-End of Line, Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Sachsen 09126, Germany.

Martin Claus (M)

Center for Advancing Electronics Dresden CFAED, Dresden, Saxony 01062, Germany.

Stefan E Schulz (SE)

Center for Microtechnologies, Chemnitz University of Technology, Chemnitz, Sachsen 09126, Germany.
Center for Advancing Electronics Dresden CFAED, Dresden, Saxony 01062, Germany.
Department Back-End of Line, Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Sachsen 09126, Germany.

Michael Schröter (M)

Chair for Electron Devices and Integrated Circuits, Dresden University of Technology, Dresden, Sachsen 01062, Germany.

Sascha Hermann (S)

Center for Microtechnologies, Chemnitz University of Technology, Chemnitz, Sachsen 09126, Germany.
Center for Advancing Electronics Dresden CFAED, Dresden, Saxony 01062, Germany.
Department Back-End of Line, Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Sachsen 09126, Germany.

Classifications MeSH