High-Temperature Charge-Stripe Correlations in La_{1.675}Eu_{0.2}Sr_{0.125}CuO_{4}.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
08 May 2020
Historique:
revised: 02 03 2020
received: 26 11 2019
accepted: 14 04 2020
entrez: 23 5 2020
pubmed: 23 5 2020
medline: 23 5 2020
Statut: ppublish

Résumé

We use resonant inelastic x-ray scattering to investigate charge-stripe correlations in La_{1.675}Eu_{0.2}Sr_{0.125}CuO_{4}. By differentiating elastic from inelastic scattering, it is demonstrated that charge-stripe correlations precede both the structural low-temperature tetragonal phase and the transport-defined pseudogap onset. The scattering peak amplitude from charge stripes decays approximately as T^{-2} towards our detection limit. The in-plane integrated intensity, however, remains roughly temperature independent. Therefore, although the incommensurability shows a remarkably large increase at high temperature, our results are interpreted via a single scattering constituent. In fact, direct comparison to other stripe-ordered compounds (La_{1.875}Ba_{0.125}CuO_{4}, La_{1.475}Nd_{0.4}Sr_{0.125}CuO_{4}, and La_{1.875}Sr_{0.125}CuO_{4}) suggests a roughly constant integrated scattering intensity across all these compounds. Our results therefore provide a unifying picture for the charge-stripe ordering in La-based cuprates. As charge correlations in La_{1.675}Eu_{0.2}Sr_{0.125}CuO_{4} extend beyond the low-temperature tetragonal and pseudogap phase, their emergence heralds a spontaneous symmetry breaking in this compound.

Identifiants

pubmed: 32441965
doi: 10.1103/PhysRevLett.124.187002
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

187002

Auteurs

Qisi Wang (Q)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.

M Horio (M)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.

K von Arx (K)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.

Y Shen (Y)

State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.

D John Mukkattukavil (D)

Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala, Sweden.

Y Sassa (Y)

Department of Physics, Chalmers University of Technology, SE-412 96 Göteborg, Sweden.

O Ivashko (O)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.

C E Matt (CE)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.
Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.

S Pyon (S)

Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.

T Takayama (T)

Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.

H Takagi (H)

Department of Advanced Materials, University of Tokyo, Kashiwa 277-8561, Japan.

T Kurosawa (T)

Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.

N Momono (N)

Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.
Department of Applied Sciences, Muroran Institute of Technology, Muroran 050-8585, Japan.

M Oda (M)

Department of Physics, Hokkaido University, Sapporo 060-0810, Japan.

T Adachi (T)

Department of Engineering and Applied Sciences, Sophia University, Tokyo 102-8554, Japan.

S M Haidar (SM)

Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan.

Y Koike (Y)

Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan.

Y Tseng (Y)

Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.

W Zhang (W)

Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.

J Zhao (J)

State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093, China.

K Kummer (K)

European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38043 Grenoble, France.

M Garcia-Fernandez (M)

Diamond Light Source, Harwell Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom.

Ke-Jin Zhou (KJ)

Diamond Light Source, Harwell Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom.

N B Christensen (NB)

Department of Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark.

H M Rønnow (HM)

Institute of Physics, École Polytechnique Fedérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland.

T Schmitt (T)

Swiss Light Source, Photon Science Division, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.

J Chang (J)

Physik-Institut, Universität Zürich, Winterthurerstrasse 190, CH-8057 Zürich, Switzerland.

Classifications MeSH