Rotationally Resolved Excitation Spectra Measured by Slow Electron Detachment from Si

Journal

The journal of physical chemistry letters
ISSN: 1948-7185
Titre abrégé: J Phys Chem Lett
Pays: United States
ID NLM: 101526034

Informations de publication

Date de publication:
02 Jul 2020
Historique:
pubmed: 11 6 2020
medline: 11 6 2020
entrez: 11 6 2020
Statut: ppublish

Résumé

Laser-induced delayed electron detachment from Si

Identifiants

DOI: 10.1021/acs.jpclett.0c01057 PMID: 32519868
pubmed: 32519868
doi: 10.1021/acs.jpclett.0c01057
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

5199-5203

Auteurs

Shimpei Iida (S)

Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.
ORCID: 0000-0002-0432-4112

Susumu Kuma (S)

Atomic, Molecular and Optical Physics Laboratory, RIKEN, Wako, Saitama 351-0198, Japan.

Jun Matsumoto (J)

Department of Chemistry, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.

Takeshi Furukawa (T)

Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.

Hajime Tanuma (H)

Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.

Toshiyuki Azuma (T)

Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.
Atomic, Molecular and Optical Physics Laboratory, RIKEN, Wako, Saitama 351-0198, Japan.

Haruo Shiromaru (H)

Department of Chemistry, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.

Vitali Zhaunerchyk (V)

Department of Physics, University of Gothenburg, 41296 Gothenburg, Sweden.
ORCID: 0000-0001-7302-7413

Klavs Hansen (K)

Center for Joint Quantum Studies and Department of Physics, School of Science, Tianjin University, Tianjin 300350, China.
School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China.
ORCID: 0000-0001-9746-3711

Classifications MeSH