Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law.

2D Materials Diffraction Non-centrosymmetric Pixelated detector Polar

Journal

Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702

Informations de publication

Date de publication:
Aug 2020
Historique:
received: 01 08 2019
revised: 26 03 2020
accepted: 07 05 2020
pubmed: 11 6 2020
medline: 11 6 2020
entrez: 11 6 2020
Statut: ppublish

Résumé

Friedel's law guarantees an inversion-symmetric diffraction pattern for thin, light materials where a kinematic approximation or a single-scattering model holds. Typically, breaking Friedel symmetry is ascribed to multiple scattering events within thick, non-centrosymmetric crystals. However, two-dimensional (2D) materials such as a single monolayer of MoS

Identifiants

pubmed: 32521385
pii: S0304-3991(19)30258-X
doi: 10.1016/j.ultramic.2020.113019
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

113019

Informations de copyright

Copyright © 2020 Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of Competing Interest None.

Auteurs

Pratiti Deb (P)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.

Michael C Cao (MC)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.

Yimo Han (Y)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.

Megan E Holtz (ME)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.

Saien Xie (S)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.; Department of Chemistry, Pritzker School of Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL 60637, USA.

Jiwoong Park (J)

Department of Chemistry, Pritzker School of Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL 60637, USA.

Robert Hovden (R)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.

David A Muller (DA)

School of Applied and Engineering Physics, Cornell University, Ithaca, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, USA. Electronic address: dm24@cornell.edu.

Classifications MeSH