Molecular Beam Epitaxy of Transition Metal (Ti-, V-, and Cr-) Tellurides: From Monolayer Ditellurides to Multilayer Self-Intercalation Compounds.
2D materials
intercalation compounds
molecular beam epitaxy (MBE)
scanning tunneling microscopy
tellurides
thin films
transition metal dichalcogenides
Journal
ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589
Informations de publication
Date de publication:
28 Jul 2020
28 Jul 2020
Historique:
pubmed:
26
6
2020
medline:
26
6
2020
entrez:
26
6
2020
Statut:
ppublish
Résumé
Material growth by van der Waals epitaxy has the potential to isolate monolayer (ML) materials and synthesize ultrathin films not easily prepared by exfoliation or other growth methods. Here, the synthesis of the early transition metal (Ti, V, and Cr) tellurides by molecular beam epitaxy (MBE) in the mono- to few-layer regime is investigated. The layered ditellurides of these materials are known for their intriguing quantum- and layer dependent- properties. Here we show by a combination of
Identifiants
pubmed: 32584543
doi: 10.1021/acsnano.0c02712
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM