Interference and interferometry in electron holography.
electron holography
electron wave
interference microscopy
phase
reconstruction
transmission electron microscopy
wavefront
Journal
Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834
Informations de publication
Date de publication:
01 Feb 2021
01 Feb 2021
Historique:
received:
14
05
2020
revised:
12
06
2020
accepted:
22
06
2020
pubmed:
27
6
2020
medline:
27
6
2020
entrez:
27
6
2020
Statut:
ppublish
Résumé
This paper reviews the basics of electron holography as an introduction of the holography part of this special issue in Microscopy. We discuss the general principle of holography and interferometry regarding measurements and analyses of phase distributions, first using the optical holography. Next, we discuss physical phenomena peculiar to electron waves that cannot be realized by light waves and principles of electromagnetic field detection and observation methods. Furthermore, we discuss the interference optical systems of the electron waves and their features, and methods of reconstruction of the phase information from electron holograms, which are essential for realization of practical electron holography. We note that following this review application of electron holography will be discussed in detail in the papers of this special issue.
Identifiants
pubmed: 32589205
pii: 5862540
doi: 10.1093/jmicro/dfaa033
pmc: PMC7850541
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
3-16Informations de copyright
© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.