Temperature-Induced Lifshitz Transition and Possible Excitonic Instability in ZrSiSe.
Journal
Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141
Informations de publication
Date de publication:
12 Jun 2020
12 Jun 2020
Historique:
revised:
06
04
2020
received:
04
12
2019
accepted:
22
05
2020
entrez:
1
7
2020
pubmed:
1
7
2020
medline:
1
7
2020
Statut:
ppublish
Résumé
The nodal-line semimetals have attracted immense interest due to the unique electronic structures such as the linear dispersion and the vanishing density of states as the Fermi energy approaching the nodes. Here, we report temperature-dependent transport and scanning tunneling microscopy (spectroscopy) [STM(S)] measurements on nodal-line semimetal ZrSiSe. Our experimental results and theoretical analyses consistently demonstrate that the temperature induces Lifshitz transitions at 80 and 106 K in ZrSiSe, which results in the transport anomalies at the same temperatures. More strikingly, we observe a V-shaped dip structure around Fermi energy from the STS spectrum at low temperature, which can be attributed to co-effect of the spin-orbit coupling and excitonic instability. Our observations indicate the correlation interaction may play an important role in ZrSiSe, which owns the quasi-two-dimensional electronic structures.
Identifiants
pubmed: 32603145
doi: 10.1103/PhysRevLett.124.236601
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM