Design and Characterization of a Sharp GaAs/Zn(Mn)Se Heterovalent Interface: A Sub-Nanometer Scale View.
Mn impurities
ZnSe/GaAs interface
diffusion
diluted magnetic semiconductors
dopants
segregation
Journal
Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216
Informations de publication
Date de publication:
04 Jul 2020
04 Jul 2020
Historique:
received:
07
06
2020
revised:
28
06
2020
accepted:
01
07
2020
entrez:
9
7
2020
pubmed:
9
7
2020
medline:
9
7
2020
Statut:
epublish
Résumé
The distribution of magnetic impurities (Mn) across a GaAs/Zn(Mn)Se heterovalent interface is investigated combining three experimental techniques: Cross-Section Scanning Tunnel Microscopy (X-STM), Atom Probe Tomography (APT), and Secondary Ions Mass Spectroscopy (SIMS). This unique combination allowed us to probe the Mn distribution with excellent sensitivity and sub-nanometer resolution. Our results show that the diffusion of Mn impurities in GaAs is strongly suppressed; conversely, Mn atoms are subject to a substantial redistribution in the ZnSe layer, which is affected by the growth conditions and the presence of an annealing step. These results show that it is possible to fabricate a sharp interface between a magnetic semiconductor (Zn(Mn)Se) and high quality GaAs, with low dopant concentration and good optical properties.
Identifiants
pubmed: 32635471
pii: nano10071315
doi: 10.3390/nano10071315
pmc: PMC7407323
pii:
doi:
Types de publication
Journal Article
Langues
eng
Subventions
Organisme : Russian Science Foundation
ID : 14-42-00015
Organisme : Nederlandse Organisatie voor Wetenschappelijk Onderzoek
ID : DMS 1115252
Références
Phys Rev Lett. 2005 Jul 1;95(1):017201
pubmed: 16090648
Ultramicroscopy. 2013 Sep;132:186-92
pubmed: 23489910
J Microsc. 2001 Sep;203(Pt 3):295-302
pubmed: 11555147
Microsc Microanal. 2007 Dec;13(6):428-36
pubmed: 18001509
Nat Nanotechnol. 2015 Jan;10(1):35-9
pubmed: 25531088
Phys Rev Lett. 2005 Jan 21;94(2):026407
pubmed: 15698206
Phys Rev Lett. 2004 May 28;92(21):216806
pubmed: 15245308
Ultramicroscopy. 2007 Feb-Mar;107(2-3):131-9
pubmed: 16938398