Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope.
1.2-MV field-emission transmission electron microscope
Mach-Zehnder interferometer
amplitude-division interferometer
electron interferometer
Journal
Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834
Informations de publication
Date de publication:
03 Dec 2020
03 Dec 2020
Historique:
received:
23
04
2020
revised:
02
07
2020
accepted:
09
07
2020
pubmed:
16
7
2020
medline:
16
7
2020
entrez:
16
7
2020
Statut:
ppublish
Résumé
We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.
Identifiants
pubmed: 32667646
pii: 5871853
doi: 10.1093/jmicro/dfaa040
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
411-416Informations de copyright
© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.