Atomic force microscopy: Emerging illuminated and operando techniques for solar fuel research.


Journal

The Journal of chemical physics
ISSN: 1089-7690
Titre abrégé: J Chem Phys
Pays: United States
ID NLM: 0375360

Informations de publication

Date de publication:
14 Jul 2020
Historique:
entrez: 17 7 2020
pubmed: 17 7 2020
medline: 17 7 2020
Statut: ppublish

Résumé

Integrated photoelectrochemical devices rely on the synergy between components to efficiently generate sustainable fuels from sunlight. The micro- and/or nanoscale characteristics of the components and their interfaces often control critical processes of the device, such as charge-carrier generation, electron and ion transport, surface potentials, and electrocatalysis. Understanding the spatial properties and structure-property relationships of these components can provide insight into designing scalable and efficient solar fuel components and systems. These processes can be probed ex situ or in situ with nanometer-scale spatial resolution using emerging scanning-probe techniques based on atomic force microscopy (AFM). In this Perspective, we summarize recent developments of AFM-based techniques relevant to solar fuel research. We review recent progress in AFM for (1) steady-state and dynamic light-induced surface photovoltage measurements; (2) nanoelectrical conductive measurements to resolve charge-carrier heterogeneity and junction energetics; (3) operando investigations of morphological changes, as well as surface electrochemical potentials, currents, and photovoltages in liquids. Opportunities for research include: (1) control of ambient conditions for performing AFM measurements; (2) in situ visualization of corrosion and morphological evolution of electrodes; (3) operando AFM techniques to allow nanoscale mapping of local catalytic activities and photo-induced currents and potentials.

Identifiants

pubmed: 32668946
doi: 10.1063/5.0009858
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

020902

Auteurs

Weilai Yu (W)

Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125, USA.

Harold J Fu (HJ)

Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125, USA.

Thomas Mueller (T)

Bruker Nano Surfaces, 112 Robin Hill Road, Santa Barbara, California 93111, USA.

Bruce S Brunschwig (BS)

Beckman Institute, California Institute of Technology, Pasadena, California 91125, USA.

Nathan S Lewis (NS)

Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125, USA.

Classifications MeSH