X-ray diffraction using focused-ion-beam-prepared single crystals.
X-ray diffraction
focused ion beams
sample preparation
Journal
Journal of applied crystallography
ISSN: 0021-8898
Titre abrégé: J Appl Crystallogr
Pays: United States
ID NLM: 9876190
Informations de publication
Date de publication:
01 Jun 2020
01 Jun 2020
Historique:
received:
15
07
2019
accepted:
06
03
2020
entrez:
21
7
2020
pubmed:
21
7
2020
medline:
21
7
2020
Statut:
epublish
Résumé
High-quality single-crystal X-ray diffraction measurements are a prerequisite for obtaining precise and reliable structure data and electron densities. The single crystal should therefore fulfill several conditions, of which a regular defined shape is of particularly high importance for compounds consisting of heavy elements with high X-ray absorption coefficients. The absorption of X-rays passing through a 50 µm-thick LiNbO
Identifiants
pubmed: 32684876
doi: 10.1107/S1600576720003143
pii: in5030
pmc: PMC7312134
doi:
Types de publication
Journal Article
Langues
eng
Pagination
614-622Informations de copyright
© Tina Weigel et al. 2020.
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