3D Ordering at the Liquid-Solid Polar Interface of Nanowires.

liquid ordering liquid-solid interface nanowires

Journal

Advanced materials (Deerfield Beach, Fla.)
ISSN: 1521-4095
Titre abrégé: Adv Mater
Pays: Germany
ID NLM: 9885358

Informations de publication

Date de publication:
Sep 2020
Historique:
received: 13 02 2020
revised: 29 06 2020
pubmed: 8 8 2020
medline: 8 8 2020
entrez: 8 8 2020
Statut: ppublish

Résumé

The nature of the liquid-solid interface determines the characteristics of a variety of physical phenomena, including catalysis, electrochemistry, lubrication, and crystal growth. Most of the established models for crystal growth are based on macroscopic thermodynamics, neglecting the atomistic nature of the liquid-solid interface. Here, experimental observations and molecular dynamics simulations are employed to identify the 3D nature of an atomic-scale ordering of liquid Ga in contact with solid GaAs in a nanowire growth configuration. An interplay between the liquid ordering and the formation of a new bilayer is revealed, which, contrary to the established theories, suggests that the preference for a certain polarity and polytypism is influenced by the atomic structure of the interface. The conclusions of this work open new avenues for the understanding of crystal growth, as well as other processes and systems involving a liquid-solid interface.

Identifiants

pubmed: 32762011
doi: 10.1002/adma.202001030
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

e2001030

Subventions

Organisme : SNF Back-Up Schemes Consolidator
ID : BSC-GI0_157705
Organisme : NCCR QSIT
Organisme : NCCR MARVEL
Organisme : Swiss National Science Foundation
Pays : Switzerland
Organisme : Generalitat de Catalunya
ID : 2017 SGR 327
Organisme : MINECO
ID : ENE2017-85087-C3
Organisme : MINECO
ID : SEV-2017-0706
Organisme : CERCA Programme
Organisme : Generalitat de Catalunya
Organisme : Engineering and Physical Sciences Research Council

Informations de copyright

© 2020 The Authors. Published by Wiley-VCH GmbH.

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Auteurs

Mahdi Zamani (M)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Giulio Imbalzano (G)

Laboratory of Computational Science and Modeling, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Nicolas Tappy (N)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Duncan T L Alexander (DTL)

Electron Spectrometry and Microscopy Laboratory, Institute of Physics, Faculty of Basic Sciences, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.
Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Sara Martí-Sánchez (S)

Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, Barcelona, Catalonia, 08193, Spain.

Lea Ghisalberti (L)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Quentin M Ramasse (QM)

SuperSTEM Laboratory, SciTech Daresbury Campus, Keckwick Lane, Daresbury, WA4 4AD, UK.
School of Chemical and Process Engineering and School of Physics and Astronomy, University of Leeds, Leeds, LS2 9JT, UK.

Martin Friedl (M)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Gözde Tütüncüoglu (G)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Luca Francaviglia (L)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Sebastien Bienvenue (S)

Laboratory of Computational Science and Modeling, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Cécile Hébert (C)

Electron Spectrometry and Microscopy Laboratory, Institute of Physics, Faculty of Basic Sciences, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.
Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Jordi Arbiol (J)

Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, Barcelona, Catalonia, 08193, Spain.
ICREA, Pg. Lluís Companys 23, Barcelona, Catalonia, 08010, Spain.

Michele Ceriotti (M)

Laboratory of Computational Science and Modeling, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Anna Fontcuberta I Morral (A)

Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.
Institute of Physics, Faculty of Basic Sciences, École Polytechnique Fédérale de Lausanne, EPFL, Lausanne, 1015, Switzerland.

Classifications MeSH