Dislocation analysis of germanium wafers under 1080 nm laser ablation.


Journal

Applied optics
ISSN: 1539-4522
Titre abrégé: Appl Opt
Pays: United States
ID NLM: 0247660

Informations de publication

Date de publication:
10 Aug 2020
Historique:
entrez: 14 8 2020
pubmed: 14 8 2020
medline: 14 8 2020
Statut: ppublish

Résumé

COMSOL Multiphysics was employed to establish a dislocation model based on the Alexander and Haasen (AH) model, the heat conduction equation, and Hooke's law for calculating the dislocation distribution of germanium (Ge) under laser irradiation. The numerical simulation results were obtained. A continuous 1080 nm laser was utilized to ablate the monocrystalline Ge wafers to validate the model. The experimental results show that no surface damage appears until the irradiances go up to 234

Identifiants

pubmed: 32788770
pii: 433963
doi: 10.1364/AO.387936
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

6803-6808

Auteurs

Classifications MeSH