Dislocation analysis of germanium wafers under 1080 nm laser ablation.
Journal
Applied optics
ISSN: 1539-4522
Titre abrégé: Appl Opt
Pays: United States
ID NLM: 0247660
Informations de publication
Date de publication:
10 Aug 2020
10 Aug 2020
Historique:
entrez:
14
8
2020
pubmed:
14
8
2020
medline:
14
8
2020
Statut:
ppublish
Résumé
COMSOL Multiphysics was employed to establish a dislocation model based on the Alexander and Haasen (AH) model, the heat conduction equation, and Hooke's law for calculating the dislocation distribution of germanium (Ge) under laser irradiation. The numerical simulation results were obtained. A continuous 1080 nm laser was utilized to ablate the monocrystalline Ge wafers to validate the model. The experimental results show that no surface damage appears until the irradiances go up to 234
Identifiants
pubmed: 32788770
pii: 433963
doi: 10.1364/AO.387936
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM