In situ nanoscale imaging of moiré superlattices in twisted van der Waals heterostructures.
Journal
Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555
Informations de publication
Date de publication:
21 Aug 2020
21 Aug 2020
Historique:
received:
26
05
2020
accepted:
04
08
2020
entrez:
23
8
2020
pubmed:
23
8
2020
medline:
23
8
2020
Statut:
epublish
Résumé
Direct visualization of nanometer-scale properties of moiré superlattices in van der Waals heterostructure devices is a critically needed diagnostic tool for study of the electronic and optical phenomena induced by the periodic variation of atomic structure in these complex systems. Conventional imaging methods are destructive and insensitive to the buried device geometries, preventing practical inspection. Here we report a versatile scanning probe microscopy employing infrared light for imaging moiré superlattices of twisted bilayers graphene encapsulated by hexagonal boron nitride. We map the pattern using the scattering dynamics of phonon polaritons launched in hexagonal boron nitride capping layers via its interaction with the buried moiré superlattices. We explore the origin of the double-line features imaged and show the mechanism of the underlying effective phase change of the phonon polariton reflectance at domain walls. The nano-imaging tool developed provides a non-destructive analytical approach to elucidate the complex physics of moiré engineered heterostructures.
Identifiants
pubmed: 32826888
doi: 10.1038/s41467-020-18109-0
pii: 10.1038/s41467-020-18109-0
pmc: PMC7442634
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
4209Subventions
Organisme : DOE | Advanced Research Projects Agency - Energy (Advanced Research Projects Agency - Energy - U.S. Department of Energy)
ID : DE-SC0019300
Organisme : U.S. Department of Defense (United States Department of Defense)
ID : N00014-18-1-2877
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