Recent advances in small-angle electron diffraction and Lorentz microscopy.

Lorentz microscopy magnetic skyrmion magnetic stripe domain small-angle electron diffraction

Journal

Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834

Informations de publication

Date de publication:
01 Feb 2021
Historique:
received: 12 06 2020
revised: 07 08 2020
accepted: 20 08 2020
pubmed: 26 8 2020
medline: 26 8 2020
entrez: 26 8 2020
Statut: ppublish

Résumé

We describe small-angle electron diffraction (SmAED) and Lorentz microscopy using a conventional transmission electron microscope. In SmAED, electron diffraction patterns with a wide-angular range on the order of 1 × 10-2 rad to 1 × 10-7 rad can be obtained. It is demonstrated that magnetic information of nanoscale magnetic microstructures can be obtained by Fresnel imaging, Foucault imaging and SmAED. In particular, we report magnetic microstructures associated with magnetic stripes and magnetic skyrmions revealed by Lorentz microscopy with SmAED. SmAED can be applied to the analysis of microstructures in functional materials such as dielectric, ferromagnetic and multiferroic materials.

Identifiants

pubmed: 32840320
pii: 5896897
doi: 10.1093/jmicro/dfaa048
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

59-68

Informations de copyright

© The Author(s) 2021. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Auteurs

Shigeo Mori (S)

Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.

Hiroshi Nakajima (H)

Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.

Atsuhiro Kotani (A)

Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.

Ken Harada (K)

Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.
Center for Emergent Matter Science (CEMS), the Institute of Physical and Chemical Research (RIKEN), Hatoyama, Saitama 350-0395, Japan.

Classifications MeSH