Particle Size Distributions for Cellulose Nanocrystals Measured by Transmission Electron Microscopy: An Interlaboratory Comparison.


Journal

Analytical chemistry
ISSN: 1520-6882
Titre abrégé: Anal Chem
Pays: United States
ID NLM: 0370536

Informations de publication

Date de publication:
06 10 2020
Historique:
pubmed: 1 9 2020
medline: 1 9 2020
entrez: 1 9 2020
Statut: ppublish

Résumé

Particle size is a key parameter that must be measured to ensure reproducible production of cellulose nanocrystals (CNCs) and to achieve reliable performance metrics for specific CNC applications. Nevertheless, size measurements for CNCs are challenging due to their broad size distribution, irregular rod-shaped particles, and propensity to aggregate and agglomerate. We report an interlaboratory comparison (ILC) that tests transmission electron microscopy (TEM) protocols for image acquisition and analysis. Samples of CNCs were prepared on TEM grids in a single laboratory, and detailed data acquisition and analysis protocols were provided to participants. CNCs were imaged and the size of individual particles was analyzed in 10 participating laboratories that represent a cross section of academic, industrial, and government laboratories with varying levels of experience with imaging CNCs. The data for each laboratory were fit to a skew normal distribution that accommodates the variability in central location and distribution width and asymmetries for the various datasets. Consensus values were obtained by modeling the variation between laboratories using a skew normal distribution. This approach gave consensus distributions with values for mean, standard deviation, and shape factor of 95.8, 38.2, and 6.3 nm for length and 7.7, 2.2, and 2.9 nm for width, respectively. Comparison of the degree of overlap between distributions for individual laboratories indicates that differences in imaging resolution contribute to the variation in measured widths. We conclude that the selection of individual CNCs for analysis and the variability in CNC agglomeration and staining are the main factors that lead to variations in measured length and width between laboratories.

Identifiants

pubmed: 32865398
doi: 10.1021/acs.analchem.0c02805
pmc: PMC8262570
mid: NIHMS1714424
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

13434-13442

Subventions

Organisme : Intramural NIST DOC
ID : 9999-NIST
Pays : United States

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Auteurs

Juris Meija (J)

National Research Council Canada, Ottawa, Ontario K1A 0R6, Canada.

Michael Bushell (M)

National Research Council Canada, Ottawa, Ontario K1A 0R6, Canada.

Martin Couillard (M)

National Research Council Canada, Ottawa, Ontario K1A 0R6, Canada.

Stephanie Beck (S)

FPInnovations, Pointe-Claire, Quebec H9R 3J9, Canada.

John Bonevich (J)

Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Kai Cui (K)

National Research Council Canada, Nanotechnology Research Centre, Edmonton, Alberta T6G 2M9, Canada.

Johan Foster (J)

Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, United States.
Chemical and Biological Engineering, The University of British Columbia, Vancouver, British Columbia V6T 1Z3, Canada.

John Will (J)

Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, United States.

Douglas Fox (D)

Department of Chemistry, American University, Washington, District of Columbia 20016, United States.

Whirang Cho (W)

Department of Chemistry, American University, Washington, District of Columbia 20016, United States.

Markus Heidelmann (M)

Interdisciplinary Center for Analytics on the Nanoscale, University of Duisburg-Essen, 47057 Duisburg, Germany.

Byong Chon Park (BC)

Center for Nanocharacterization, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.

Yun Chang Park (YC)

Division of Measurement & Analysis, National Nanofab Center, Daejeon 34141, Republic of Korea.

Lingling Ren (L)

National Institute of Metrology, Chaoyang District, Beijing 100029, China.

Li Xu (L)

National Institute of Metrology, Chaoyang District, Beijing 100029, China.

Aleksandr B Stefaniak (AB)

National Institute for Occupational Safety and Health, Morgantown, West Virginia 26505, United States.

Alycia K Knepp (AK)

National Institute for Occupational Safety and Health, Morgantown, West Virginia 26505, United States.

Ralf Theissmann (R)

KRONOS INTERNATIONAL Inc., Peschstrasse 5, 51373 Leverkusen, Germany.

Horst Purwin (H)

KRONOS INTERNATIONAL Inc., Peschstrasse 5, 51373 Leverkusen, Germany.

Ziqiu Wang (Z)

Electron Microscopy Laboratory, National Cancer Institute, Center for Cancer Research, Leidos Biomedical Research, Frederick National Laboratory, Frederick, Maryland 21702, United States.

Natalia de Val (N)

Electron Microscopy Laboratory, National Cancer Institute, Center for Cancer Research, Leidos Biomedical Research, Frederick National Laboratory, Frederick, Maryland 21702, United States.

Linda J Johnston (LJ)

National Research Council Canada, Ottawa, Ontario K1A 0R6, Canada.

Classifications MeSH