Effect of ultrasonic frequency and surfactant addition on microcapsule destruction.

High-frequency ultrasonic waves Microcapsules Physical effect Polydisperse Sodium dodecyl sulfate (SDS)

Journal

Ultrasonics sonochemistry
ISSN: 1873-2828
Titre abrégé: Ultrason Sonochem
Pays: Netherlands
ID NLM: 9433356

Informations de publication

Date de publication:
Jan 2021
Historique:
received: 24 03 2020
revised: 12 08 2020
accepted: 12 08 2020
pubmed: 2 9 2020
medline: 2 9 2020
entrez: 2 9 2020
Statut: ppublish

Résumé

In a previous study, we found that cavitation bubbles cause the ultrasonic destruction of microcapsules containing oil in a shell made of melamine resin. The cavitation bubbles can be smaller or larger than the resonance size; smaller bubbles cause Rayleigh contraction, whereas larger bubbles are not involved in the sonochemical reaction. The activity in and around the bubble (e.g., shear stress, shock wave, microjet, sonochemical reaction, and sonoluminescence) varies substantially depending on the bubble size. In this study, we investigated the mechanism of the ultrasonic destruction of microcapsules by examining the correlations between frequency and microcapsule destruction rate and between microcapsule size and cavitation bubble size. We evaluated the bubbles using multibubble sonoluminescence and the bubble size was changed by adding a surfactant to the microcapsule suspension. The microcapsule destruction was frequency dependent. The main cause of microcapsule destruction was identified as mechanical resonance, although the relationship between bubble size and microcapsule size suggested that bubbles smaller than or equal to the microcapsule size may also destroy microcapsules by applying shear stress locally.

Identifiants

pubmed: 32871383
pii: S1350-4177(20)30547-2
doi: 10.1016/j.ultsonch.2020.105308
pmc: PMC7786529
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

105308

Informations de copyright

Copyright © 2020 Elsevier B.V. All rights reserved.

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Auteurs

Ayaka Inui (A)

Department of Pure and Applied Physics, Faculty of Engineering Science, Kansai University, Osaka 564-8680, Japan. Electronic address: k343390@kansai-u.ac.jp.

Atsushi Honda (A)

Department of Pure and Applied Physics, Faculty of Engineering Science, Kansai University, Osaka 564-8680, Japan.

Shohei Yamanaka (S)

Department of Pure and Applied Physics, Faculty of Engineering Science, Kansai University, Osaka 564-8680, Japan.

Takashi Ikeno (T)

Department of Pure and Applied Physics, Faculty of Engineering Science, Kansai University, Osaka 564-8680, Japan.

Ken Yamamoto (K)

Department of Pure and Applied Physics, Faculty of Engineering Science, Kansai University, Osaka 564-8680, Japan. Electronic address: ken@kansai-u.ac.jp.

Classifications MeSH