Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence.
Intensity correlation
SACLA
X-ray fluorescence
X-ray focusing
X-ray free-electron lasers
focus characterization
Journal
Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878
Informations de publication
Date de publication:
01 Sep 2020
01 Sep 2020
Historique:
received:
31
03
2020
accepted:
18
07
2020
entrez:
3
9
2020
pubmed:
3
9
2020
medline:
3
9
2020
Statut:
ppublish
Résumé
This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged.
Identifiants
pubmed: 32876613
pii: S1600577520009868
doi: 10.1107/S1600577520009868
pmc: PMC7467341
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
1366-1371Subventions
Organisme : Japan Society for the Promotion of Science
ID : JP16H06358
Organisme : Japan Society for the Promotion of Science
ID : JP17H01073
Organisme : Japan Society for the Promotion of Science
ID : JP19K20604
Organisme : Japan Society for the Promotion of Science
ID : JP19K23434
Organisme : Japan Society for the Promotion of Science
ID : JP18K18307
Informations de copyright
open access.
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