Directly measuring the structural transition pathways of strain-engineered VO


Journal

Nanoscale
ISSN: 2040-3372
Titre abrégé: Nanoscale
Pays: England
ID NLM: 101525249

Informations de publication

Date de publication:
28 Sep 2020
Historique:
pubmed: 9 9 2020
medline: 9 9 2020
entrez: 8 9 2020
Statut: ppublish

Résumé

Epitaxial films of vanadium dioxide (VO

Identifiants

pubmed: 32896856
doi: 10.1039/d0nr04776g
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

18857-18863

Auteurs

Egor Evlyukhin (E)

Department of Physics, Applied Physics and Astronomy, Binghamton University, Binghamton, New York 13902, USA. eevlyukh@binghamton.edu lpiper@binghamton.edu.

Classifications MeSH