Deciphering the effect of traps on electronic charge transport properties of methylammonium lead tribromide perovskite.
Journal
Science advances
ISSN: 2375-2548
Titre abrégé: Sci Adv
Pays: United States
ID NLM: 101653440
Informations de publication
Date de publication:
Sep 2020
Sep 2020
Historique:
received:
08
03
2020
accepted:
29
07
2020
entrez:
12
9
2020
pubmed:
13
9
2020
medline:
13
9
2020
Statut:
epublish
Résumé
Halide perovskites have undergone remarkable developments as highly efficient optoelectronic materials for a variety of applications. Several studies indicated the critical role of defects on the performance of perovskite devices. However, the parameters of defects and their interplay with free charge carriers remain unclear. In this study, we explored the dynamics of free holes in methylammonium lead tribromide (MAPbBr
Identifiants
pubmed: 32917707
pii: 6/37/eabb6393
doi: 10.1126/sciadv.abb6393
pmc: PMC7486106
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Informations de copyright
Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).
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