Highly Ordered Boron Nitride/Epigraphene Epitaxial Films on Silicon Carbide by Lateral Epitaxial Deposition.

MOVPE ab initio calculations boron nitride epitaxial growth graphene silicon carbide van der Waals heterostructures

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
27 Oct 2020
Historique:
pubmed: 24 9 2020
medline: 24 9 2020
entrez: 23 9 2020
Statut: ppublish

Résumé

The realization of high-performance nanoelectronics requires control of materials at the nanoscale. Methods to produce high quality epitaxial graphene (EG) nanostructures on silicon carbide are known. The next step is to grow van der Waals semiconductors on top of EG nanostructures. Hexagonal boron nitride (h-BN) is a wide bandgap semiconductor with a honeycomb lattice structure that matches that of graphene, making it ideally suited for graphene-based nanoelectronics. Here, we describe the preparation and characterization of multilayer h-BN grown epitaxially on EG using a migration-enhanced metalorganic vapor phase epitaxy process. As a result of the lateral epitaxial deposition (LED) mechanism, the grown h-BN/EG heterostructures have highly ordered epitaxial interfaces, as desired in order to preserve the transport properties of pristine graphene. Atomic scale structural and energetic details of the observed row-by-row growth mechanism of the two-dimensional (2D) epitaxial h-BN film are analyzed through first-principles simulations, demonstrating one-dimensional nucleation-free-energy-barrierless growth. This industrially relevant LED process can be applied to a wide variety of van der Waals materials.

Identifiants

pubmed: 32966058
doi: 10.1021/acsnano.0c04164
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

12962-12971

Auteurs

James Gigliotti (J)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Xin Li (X)

School of Electrical and Computer Engineering, Georgia Institute of Technology, GT-Lorraine, 57070 Metz, France.
Unité Mixte Internationale 2958, CNRS-Georgia Tech, 57070 Metz, France.

Suresh Sundaram (S)

School of Electrical and Computer Engineering, Georgia Institute of Technology, GT-Lorraine, 57070 Metz, France.
Unité Mixte Internationale 2958, CNRS-Georgia Tech, 57070 Metz, France.

Dogukan Deniz (D)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Vladimir Prudkovskiy (V)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.
Institut Néel, CNRS-Université Grenoble Alpes, BP166, 38042 Cedex 9 Grenoble, France.

Jean-Philippe Turmaud (JP)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Yiran Hu (Y)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Yue Hu (Y)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Frédéric Fossard (F)

Laboratoire d'Etude des Microstructures, ONERA-CNRS, Université Paris Saclay, BP 72, F-92322 Châtillon, France.

Jean-Sébastien Mérot (JS)

Laboratoire d'Etude des Microstructures, ONERA-CNRS, Université Paris Saclay, BP 72, F-92322 Châtillon, France.

Annick Loiseau (A)

Laboratoire d'Etude des Microstructures, ONERA-CNRS, Université Paris Saclay, BP 72, F-92322 Châtillon, France.

Gilles Patriarche (G)

Centre de Nanosciences et de Nanotechnologies, CNRS, Université Paris-Saclay, route de Nozay, F-91460 Marcoussis, France.

Bokwon Yoon (B)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Uzi Landman (U)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.

Abdallah Ougazzaden (A)

School of Electrical and Computer Engineering, Georgia Institute of Technology, GT-Lorraine, 57070 Metz, France.
Unité Mixte Internationale 2958, CNRS-Georgia Tech, 57070 Metz, France.

Claire Berger (C)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.
Unité Mixte Internationale 2958, CNRS-Georgia Tech, 57070 Metz, France.
Institut Néel, CNRS-Université Grenoble Alpes, BP166, 38042 Cedex 9 Grenoble, France.

Walt A de Heer (WA)

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, United States.
Tianjin International Center of Nanoparticles and Nanosystems, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China.

Classifications MeSH