Investigating counterfeiting of an artwork by XRF, SEM-EDS, FTIR and synchrotron radiation induced MA-XRF at LNLS-BRAZIL.

Elemental mapping of painting Historical pigments MA-XRF Synchrotron radiation

Journal

Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy
ISSN: 1873-3557
Titre abrégé: Spectrochim Acta A Mol Biomol Spectrosc
Pays: England
ID NLM: 9602533

Informations de publication

Date de publication:
05 Feb 2021
Historique:
received: 07 04 2020
revised: 27 08 2020
accepted: 05 09 2020
pubmed: 29 9 2020
medline: 29 9 2020
entrez: 28 9 2020
Statut: ppublish

Résumé

In this work, a painting suspected of counterfeiting was analyzed using the synchrotron-based scanning macro X-ray fluorescence (MA-XRF) technique. The canvas has erasures including a signature erasure; however, some visible numbers indicate that the artwork may be from the 17th century. Through the studies' elemental maps, Cl-K and Ca-K were observed, which allowed us to reconstruct the signature present in the painting. Elemental maps of Ba-K, Ti-K, Fe-K, Zn-K, and Pb-K were also obtained from the painting, which made possible to visualize how the pigments based on these elements were used in the creative composition of the painting. In addition to the signature region, a region of the painting with dimensions of approximately 120 mm × 120 mm was investigated by synchrotron radiation induced MA-XRF, while keeping a high spatial resolution and elemental sensitivity. The measurements were carried out at the D09B micro-XRF beamline of the Brazilian Synchrotron Light Laboratory (LNLS), part of the Brazilian Center of Research in Energy and Materials, in Campinas Brazil. The painting was also investigated by SEM-EDS, and FTIR techniques. Those results, in addition to the supporting elemental maps, allowed additional information to be obtained, such as the binders used on the painting.

Identifiants

pubmed: 32987269
pii: S1386-1425(20)30904-5
doi: 10.1016/j.saa.2020.118925
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

118925

Informations de copyright

Copyright © 2020 Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of competing interest The authors confirm that there are no known conflicts of interest associated with this publication and there has been no significant financial support for this work that could have influenced its outcome.

Auteurs

Marcelo O Pereira (MO)

Centro Federal de Educação Tecnológica Celso Suckow da Fonseca - Campus Nova Iguaçu, 26041-271 Nova Iguaçu, Brazil.

Valter S Felix (VS)

Laboratório de Instrumentação e Simulação Computacional, LISCOMP/IFRJ-CPAR, 26600-000 Paracambi, Brazil.

Ana L Oliveira (AL)

Laboratório de Instrumentação e Simulação Computacional, LISCOMP/IFRJ-CPAR, 26600-000 Paracambi, Brazil.

Douglas S Ferreira (DS)

Laboratório de Instrumentação e Simulação Computacional, LISCOMP/IFRJ-CPAR, 26600-000 Paracambi, Brazil.

André R Pimenta (AR)

Laboratório de Instrumentação e Simulação Computacional, LISCOMP/IFRJ-CPAR, 26600-000 Paracambi, Brazil.

Cristiano S Carvalho (CS)

Centro Federal de Educação Tecnológica Celso Suckow da Fonseca - Campus Nova Iguaçu, 26041-271 Nova Iguaçu, Brazil.

Fabricio L Silva (FL)

Centro Federal de Educação Tecnológica Celso Suckow da Fonseca - Campus Nova Iguaçu, 26041-271 Nova Iguaçu, Brazil.

Carlos A Perez (CA)

Laboratório Nacional de Luz Síncrotron (LNLS), Centro Nacional de Pesquisa em Energia e Materiais (CNPEM), 13084-970 Campinas, SP, Brazil.

Douglas Galante (D)

Laboratório Nacional de Luz Síncrotron (LNLS), Centro Nacional de Pesquisa em Energia e Materiais (CNPEM), 13084-970 Campinas, SP, Brazil.

Renato P Freitas (RP)

Laboratório de Instrumentação e Simulação Computacional, LISCOMP/IFRJ-CPAR, 26600-000 Paracambi, Brazil. Electronic address: renato.freitas@ifrj.edu.br.

Classifications MeSH