Angular super-resolution retrieval in small-angle X-ray scattering.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
29 Sep 2020
Historique:
received: 03 06 2020
accepted: 31 08 2020
entrez: 30 9 2020
pubmed: 1 10 2020
medline: 1 10 2020
Statut: epublish

Résumé

Small-angle X-ray scattering (SAXS) techniques enable convenient nanoscopic characterization for various systems and conditions. Unlike synchrotron-based setups, lab-based SAXS systems intrinsically suffer from lower X-ray flux and limited angular resolution. Here, we develop a two-step retrieval methodology to enhance the angular resolution for given experimental conditions. Using minute hardware additions, we show that translating the X-ray detector in subpixel steps and modifying the incoming beam shape results in a set of 2D scattering images, which is sufficient for super-resolution SAXS retrieval. The technique is verified experimentally to show superior resolution. Such advantages have a direct impact on the ability to resolve finer nanoscopic structures and can be implemented in most existing SAXS apparatuses both using synchrotron- and laboratory-based sources.

Identifiants

pubmed: 32994517
doi: 10.1038/s41598-020-73030-2
pii: 10.1038/s41598-020-73030-2
pmc: PMC7525553
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

16038

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Auteurs

Benjamin Gutman (B)

School of Mathematical Sciences, Tel Aviv University, 69978, Tel Aviv, Israel.
The Center for Nanoscience and Nanotechnology, Tel Aviv University, 69978, Tel Aviv, Israel.

Michael Mrejen (M)

The Raymond and Beverly Sackler School of Physics and Astronomy, Tel Aviv University, 69978, Tel Aviv, Israel.
The Center for Nanoscience and Nanotechnology, Tel Aviv University, 69978, Tel Aviv, Israel.

Gil Shabat (G)

School of Mathematical Sciences, Tel Aviv University, 69978, Tel Aviv, Israel.

Ram Avinery (R)

The Raymond and Beverly Sackler School of Physics and Astronomy, Tel Aviv University, 69978, Tel Aviv, Israel.
The Center for Nanoscience and Nanotechnology, Tel Aviv University, 69978, Tel Aviv, Israel.

Yoel Shkolnisky (Y)

School of Mathematical Sciences, Tel Aviv University, 69978, Tel Aviv, Israel.

Roy Beck (R)

The Raymond and Beverly Sackler School of Physics and Astronomy, Tel Aviv University, 69978, Tel Aviv, Israel. roy@tauex.tau.ac.il.
The Center for Nanoscience and Nanotechnology, Tel Aviv University, 69978, Tel Aviv, Israel. roy@tauex.tau.ac.il.

Classifications MeSH