Nondestructive thickness measurement of silica scale using cathodoluminescence.

Cathodoluminescence Nondestructive analysis SiO(2) scale Thickness

Journal

Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy
ISSN: 1873-3557
Titre abrégé: Spectrochim Acta A Mol Biomol Spectrosc
Pays: England
ID NLM: 9602533

Informations de publication

Date de publication:
05 Feb 2021
Historique:
received: 23 08 2020
revised: 25 09 2020
accepted: 27 09 2020
pubmed: 14 10 2020
medline: 14 10 2020
entrez: 13 10 2020
Statut: ppublish

Résumé

The knowledge of the composition, morphology, and thickness of surface protective scales, such as SiO

Identifiants

pubmed: 33049468
pii: S1386-1425(20)31001-5
doi: 10.1016/j.saa.2020.119022
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

119022

Informations de copyright

Copyright © 2020 Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of competing interest The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Auteurs

Susumu Imashuku (S)

Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan. Electronic address: susumu.imashuku@imr.tohoku.ac.jp.

Wataru Hashimoto (W)

Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

Kazuaki Wagatsuma (K)

Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

Classifications MeSH