Preparation of Fe

Fe3+ doping MO degradation TiO2 nanotubes visible photocatalysis

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
23 Oct 2020
Historique:
received: 19 09 2020
revised: 21 10 2020
accepted: 21 10 2020
entrez: 29 10 2020
pubmed: 30 10 2020
medline: 30 10 2020
Statut: epublish

Résumé

In this paper, the Fe

Identifiants

pubmed: 33114091
pii: nano10112107
doi: 10.3390/nano10112107
pmc: PMC7690816
pii:
doi:

Types de publication

Journal Article

Langues

eng

Références

Nanomaterials (Basel). 2020 Oct 01;10(10):
pubmed: 33019690
J Hazard Mater. 2008 Jul 15;155(3):572-9
pubmed: 18191326
Nano Lett. 2007 Jun;7(6):1686-91
pubmed: 17503870
Nanomaterials (Basel). 2020 Sep 09;10(9):
pubmed: 32916899
Nanomaterials (Basel). 2020 Sep 21;10(9):
pubmed: 32967271
Angew Chem Int Ed Engl. 2011 Mar 21;50(13):2904-39
pubmed: 21394857
J Phys Chem B. 2005 Apr 21;109(15):7188-94
pubmed: 16851820
Angew Chem Int Ed Engl. 2005 Mar 29;44(14):2100-2
pubmed: 15736238
Nano Lett. 2006 Jan;6(1):24-8
pubmed: 16402781
Phys Chem Chem Phys. 2011 Sep 7;13(33):14937-45
pubmed: 21761055
Chemosphere. 2005 Jun;59(9):1367-71
pubmed: 15857649
J Chem Phys. 2004 Jun 1;120(21):10240-6
pubmed: 15268048
Nanomaterials (Basel). 2020 Sep 16;10(9):
pubmed: 32948034
Nanomaterials (Basel). 2016 Jun 06;6(6):
pubmed: 28335234
Environ Sci Technol. 2005 May 15;39(10):3770-5
pubmed: 15952384

Auteurs

Jin Zhang (J)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Chen Yang (C)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Shijie Li (S)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Yingxue Xi (Y)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Changlong Cai (C)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Weiguo Liu (W)

Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China.

Dmitriy Golosov (D)

Belarusian State University of Informatics and Radioelectronics, Electronic Technique and Technology Department, Center 10.1, Thin Film Research Laboratory, 6 P. Brovka str., 220013 Minsk, Belarus.

Sergry Zavadski (S)

Belarusian State University of Informatics and Radioelectronics, Electronic Technique and Technology Department, Center 10.1, Thin Film Research Laboratory, 6 P. Brovka str., 220013 Minsk, Belarus.

Siarhei Melnikov (S)

Belarusian State University of Informatics and Radioelectronics, Electronic Technique and Technology Department, Center 10.1, Thin Film Research Laboratory, 6 P. Brovka str., 220013 Minsk, Belarus.

Classifications MeSH