Local electronic transport across probe/ionic conductor interface in scanning probe microscopy.
Journal
Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702
Informations de publication
Date de publication:
Jan 2021
Jan 2021
Historique:
received:
26
04
2020
revised:
29
09
2020
accepted:
15
10
2020
pubmed:
2
11
2020
medline:
2
11
2020
entrez:
1
11
2020
Statut:
ppublish
Résumé
Charge carrier transport through the probe-sample junction can have substantial consequences for outcomes of electrical and electromechanical atomic-force-microscopy (AFM) measurements. For understanding physical processes under the probe, we carried out conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves as well as their derivatives on samples of a mixed ionic-electronic conductor Li
Identifiants
pubmed: 33130324
pii: S0304-3991(20)30294-1
doi: 10.1016/j.ultramic.2020.113147
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
113147Informations de copyright
Copyright © 2020 Elsevier B.V. All rights reserved.