Monitoring shot-to-shot variations of soft x-ray sources using aluminum foils.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Oct 2020
Historique:
entrez: 3 11 2020
pubmed: 4 11 2020
medline: 4 11 2020
Statut: ppublish

Résumé

We report a straightforward beam splitter in the soft x-ray spectral range using a thin oxidized aluminum foil. As it allows us to monitor reliably shot-to-shot variations in energy and in energy distribution, this beam splitter is of high interest for the simultaneous use of diagnostics for soft x-rays sources. We measure a transmission of 0.5 and a reflectivity of 0.018 at 22.5° of incidence with a soft x-ray laser working at 32.8 nm. These values are in good agreement with the theory. As the theory predicts a reflectivity and a transmission of both 12% at 52.5° of incidence for 32.8 nm, it can also be useful for experiments that require the division and recombination of a beam, for instance, interferometry or pump-probe technique with an intense soft x-ray source.

Identifiants

pubmed: 33138578
doi: 10.1063/5.0021999
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

103001

Auteurs

Adeline Kabacinski (A)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Fabien Tissandier (F)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Julien Gautier (J)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Jean-Philippe Goddet (JP)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Amar Tafzi (A)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Stéphane Sebban (S)

Laboratoire D'Optique Appliquée, ENSTA-Paristech, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 828 Bv des Maréchaux, 91762 Palaiseau, France.

Classifications MeSH