Tunable Electrical Properties of Embossed, Cellulose-Based Paper for Skin-like Sensing.

embossing piezoresistive paper skin-like sensing three-phase composite tunable conductivity

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
18 Nov 2020
Historique:
pubmed: 5 11 2020
medline: 5 11 2020
entrez: 4 11 2020
Statut: ppublish

Résumé

This article describes a process of fabricating highly porous paper from cellulosic fibers and carbon black (CB) with tunable conductivity. By embossing such paper, its porosity decreases while its conductivity increases. Tuning the porosity of composite paper alters the magnitude and trend of conductivity over a spectrum of concentrations of conductive particles. The largest increase in conductivity from 8.38 × 10

Identifiants

DOI: 10.1021/acsami.0c15073 PMID: 33146994
pubmed: 33146994
doi: 10.1021/acsami.0c15073
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

51960-51968

Auteurs

Tongfen Liang (T)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.
ORCID: 0000-0002-8296-8108

Xiyue Zou (X)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.
ORCID: 0000-0002-9129-0685

Ramendra Kishor Pal (RK)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.
ORCID: 0000-0003-3749-9848

Jingjin Xie (J)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Maame Konadu Assasie-Gyimah (MK)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Jiaqi Liu (J)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Weijian Guo (W)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Chuyang Chen (C)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Max Tenorio (M)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Daniel Sullivan (D)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Anna Root (A)

School of Arts and Sciences, Rutgers University, New Brunswick 08901, New Jersey, United States.

Paul Stansel (P)

MPS Systems, 490 Rollstone Road, Fitchburg 01420, Massachusetts, United States.

Anne Q McKeown (AQ)

Mason Gross School of Arts, Rutgers University, New Brunswick 08901, New Jersey, United States.

George J Weng (GJ)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

William W Sampson (WW)

School of Materials, The University of Manchester, Oxford Road, Manchester M13 9PL, U.K.

Assimina A Pelegri (AA)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.

Aaron D Mazzeo (AD)

Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway 08854, New Jersey, United States.
ORCID: 0000-0002-1565-7481

Classifications MeSH