Band gap measurement by nano-beam STEM with small off-axis angle transmission electron energy loss spectroscopy (TEELS).
Dielectric function
Nano-beam STEM
Off-axis EELS
Optical band gap
Reflection EELS
Transmission electron energy loss spectroscopy (TEELS)
Valence band excitation
Journal
Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702
Informations de publication
Date de publication:
Jan 2021
Jan 2021
Historique:
received:
30
01
2020
revised:
24
10
2020
accepted:
01
11
2020
pubmed:
14
11
2020
medline:
14
11
2020
entrez:
13
11
2020
Statut:
ppublish
Résumé
An energy band gap measurement method based on nano-beam STEM with small off-axis angle valence band transmission electron energy loss spectroscopy (TEELS) is reported. The effect of multiple scattering event is removed by self-convolution method to obtain a single scattering loss function and a dielectric function is calculated from the single scattering valence band energy loss function through Kramers-Kronig (K-K) analysis. Optical band gaps are extracted from energy loss spectra and the imaginary part of the dielectric functions for crystalline and amorphous SiO
Identifiants
pubmed: 33186852
pii: S0304-3991(20)30307-7
doi: 10.1016/j.ultramic.2020.113164
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
113164Informations de copyright
Copyright © 2020 Elsevier B.V. All rights reserved.