Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers.

CMOS image sensor gettering oxygen white spot defects

Journal

Sensors (Basel, Switzerland)
ISSN: 1424-8220
Titre abrégé: Sensors (Basel)
Pays: Switzerland
ID NLM: 101204366

Informations de publication

Date de publication:
19 Nov 2020
Historique:
received: 22 10 2020
revised: 13 11 2020
accepted: 17 11 2020
entrez: 24 11 2020
pubmed: 25 11 2020
medline: 25 11 2020
Statut: epublish

Résumé

The impact of hydrocarbon-molecular (C

Identifiants

pubmed: 33228009
pii: s20226620
doi: 10.3390/s20226620
pmc: PMC7699194
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Références

Sensors (Basel). 2019 May 04;19(9):
pubmed: 31060216

Auteurs

Ayumi Onaka-Masada (A)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Takeshi Kadono (T)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Ryosuke Okuyama (R)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Ryo Hirose (R)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Koji Kobayashi (K)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Akihiro Suzuki (A)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Yoshihiro Koga (Y)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Kazunari Kurita (K)

SUMCO Corporation, 1-52 Kubara, Yamashiro-cho, Imari-shi, Saga 849-4256, Japan.

Classifications MeSH