Weak Localization in Polycrystalline Tin Dioxide Films.
X-ray diffraction
electrical transport
magnetoresistance
tin dioxide films
weak localization
Journal
Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929
Informations de publication
Date de publication:
28 Nov 2020
28 Nov 2020
Historique:
received:
27
10
2020
revised:
20
11
2020
accepted:
26
11
2020
entrez:
2
12
2020
pubmed:
3
12
2020
medline:
3
12
2020
Statut:
epublish
Résumé
The electrical and magnetotransport properties of nanocrystalline tin dioxide films were studied in the temperature range of 4-300 K and in magnetic fields up to 8 T. SnO
Identifiants
pubmed: 33260733
pii: ma13235415
doi: 10.3390/ma13235415
pmc: PMC7730622
pii:
doi:
Types de publication
Journal Article
Langues
eng
Références
Phys Rev Lett. 2002 Mar 4;88(9):095501
pubmed: 11864022
Nanotechnology. 2012 Mar 16;23(10):105502
pubmed: 22362075