Electrogravimetry and Structural Properties of Thin Silicon Layers Deposited in Sulfolane and Ionic Liquid Electrolytes.
X-ray photoelectron spectroscopy
electrode−electrolyte interface
ionic liquids
quartz crystal microbalance
silicon deposition
sulfolane
Journal
ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991
Informations de publication
Date de publication:
23 Dec 2020
23 Dec 2020
Historique:
pubmed:
15
12
2020
medline:
15
12
2020
entrez:
14
12
2020
Statut:
ppublish
Résumé
Potentiostatic deposition of silicon is performed in sulfolane (SL) and ionic liquid (IL) electrolytes. Electrochemical quartz crystal microbalance with damping monitoring (EQCM-D) is used as main analytical tool for the characterization of the reduction process. The apparent molar mass (
Identifiants
pubmed: 33307677
doi: 10.1021/acsami.0c14694
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM