Study of Radiation-Induced Defects in

DLTS electron beam irradiation-induced defects silicon–germanium alloy

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
12 Dec 2020
Historique:
received: 17 11 2020
revised: 09 12 2020
accepted: 10 12 2020
entrez: 16 12 2020
pubmed: 17 12 2020
medline: 17 12 2020
Statut: epublish

Résumé

In this work, electrically active defects of pristine and 5.5 MeV electron irradiated

Identifiants

DOI: 10.3390/ma13245684 PMID: 33322844 PMC: PMC7763288
pubmed: 33322844
pii: ma13245684
doi: 10.3390/ma13245684
pmc: PMC7763288
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Lietuvos Mokslo Taryba
ID : S-LB-19-1

Références

ACS Nano. 2018 Mar 27;12(3):2900-2908
pubmed: 29529362

Auteurs

Tomas Ceponis (T)

Institute of Photonics and Nanotechnology, Vilnius University, Sauletekio ave. 3, LT-10257 Vilnius, Lithuania.

Stanislau Lastovskii (S)

Laboratory of Radiation Effects, Scientific-Practical Materials Research Centre of NAS of Belarus, P. Brovki Str.17, 220072 Minsk, Belarus.

Leonid Makarenko (L)

Department of Applied Mathematics and Computer Science, Belarusian State University, Independence Ave. 4, 220030 Minsk, Belarus.
ORCID: 0000-0002-9883-581X

Jevgenij Pavlov (J)

Institute of Photonics and Nanotechnology, Vilnius University, Sauletekio ave. 3, LT-10257 Vilnius, Lithuania.

Kornelijus Pukas (K)

Institute of Photonics and Nanotechnology, Vilnius University, Sauletekio ave. 3, LT-10257 Vilnius, Lithuania.

Eugenijus Gaubas (E)

Institute of Photonics and Nanotechnology, Vilnius University, Sauletekio ave. 3, LT-10257 Vilnius, Lithuania.

Classifications MeSH