Quantitative Analysis of Blended Asian Lacquers Using ToF-SIMS, Py-GC/MS and HPLC.

HPLC Py–GC/MS ToF–SIMS blended lacquer quantitative analysis

Journal

Polymers
ISSN: 2073-4360
Titre abrégé: Polymers (Basel)
Pays: Switzerland
ID NLM: 101545357

Informations de publication

Date de publication:
29 Dec 2020
Historique:
received: 12 12 2020
revised: 23 12 2020
accepted: 23 12 2020
entrez: 1 1 2021
pubmed: 2 1 2021
medline: 2 1 2021
Statut: epublish

Résumé

Asian lacquer is a special polymeric material tapped from lacquer trees. The tree's sap is a complex mixture of compounds, such as catechol lipids, polysaccharides, glycoproteins, enzymes, and water. Researchers have not yet quantitatively analyzed blended lacquers. We evaluated the compositions of Japanese and Vietnamese lacquers, and blends of the two, using time-of-flight secondary ion mass spectrometry (ToF-SIMS), pyrolysis-gas chromatography/mass spectrometry (Py-GC/MS), and high-performance liquid chromatography (HPLC). ToF-SIMS provided quantitative results for blended lacquers; provided structural information on polymeric lacquer films; and indicated the presence of dimers of urushiol-urushiol, urushiol-laccol, and laccol-laccol derivatives. We used Py-GC/MS and HPLC to obtain linear calibration curves. The specific peak intensity was a linear function of the ratio of Japanese to Vietnamese lacquer in the blends. For an unknown mixture, all three techniques gave essentially the same results. These quantitative methods will be useful for improving the physical properties of polymeric lacquer films, and evaluating the lacquer quality in industry and historic conservation.

Identifiants

pubmed: 33383703
pii: polym13010097
doi: 10.3390/polym13010097
pmc: PMC7795005
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Ministry of Culture, Sports, and Tourism (MCST) and the Korea Creative Content Agency (KOCCA)
ID : 2R2019020040

Références

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pubmed: 22123107
Analyst. 2013 Oct 7;138(19):5685-96
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Sci Rep. 2020 Jul 30;10(1):12867
pubmed: 32733059

Auteurs

Hye Hyun Yu (HH)

Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 02792, Korea.
Department of Chemistry, Chung-Ang University, Seoul 06974, Korea.

Jung-Ah Lim (JA)

Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology, Seoul 02792, Korea.

Seung Wook Ham (SW)

Department of Chemistry, Chung-Ang University, Seoul 06974, Korea.

Kang-Bong Lee (KB)

National Agenda Research Division, Korea Institute of Science and Technology, Seoul 02792, Korea.

Yeonhee Lee (Y)

Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 02792, Korea.

Classifications MeSH