Anisotropic Ion Migration and Electronic Conduction in van der Waals Ferroelectric CuInP
copper indium thiophosphate
ion migration
ionic conduction
van der Waals ferroelectrics
Journal
Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070
Informations de publication
Date de publication:
27 Jan 2021
27 Jan 2021
Historique:
pubmed:
7
1
2021
medline:
7
1
2021
entrez:
6
1
2021
Statut:
ppublish
Résumé
Van der Waals (vdW) thio- and seleno-phosphates have recently gained considerable attention for the use as "active" dielectrics in two-dimensional/quasi-two-dimensional electronic devices. Bulk ionic conductivity in these materials has been identified as a key factor for the control of their electronic properties. However, direct evidence of specific ion species' migration at the nanoscale, particularly under electric fields, and its impact on material properties has been elusive. Here, we report on direct evidence of a phase-selective anisotropic Cu-ion-hopping mechanism in copper indium thiophosphate (CuInP
Identifiants
pubmed: 33404251
doi: 10.1021/acs.nanolett.0c04023
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM