Optical and Electronic Losses Arising from Physically Mixed Interfacial Layers in Perovskite Solar Cells.
external quantum efficiency modeling
interfacial layers
optical and electronic losses
optical properties
perovskite solar cells
spectroscopic ellipsometry
Journal
ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991
Informations de publication
Date de publication:
03 Feb 2021
03 Feb 2021
Historique:
pubmed:
21
1
2021
medline:
21
1
2021
entrez:
20
1
2021
Statut:
ppublish
Résumé
Perovskite solar cell device performance is affected by optical and electronic losses. To minimize these losses in solar cells, it is important to identify their sources. Here, we report the optical and electronic losses arising from physically mixed interfacial layers between the adjacent component materials in highly efficient two terminal (2T) all-perovskite tandem, single-junction wide-bandgap, and single-junction narrow-bandgap perovskite-based solar cells. Physically mixed interfacial layers as the sources of optical and electronic losses are identified from spectroscopic ellipsometry measurements and data analysis followed by comparisons of simulated and measured external quantum efficiency spectra. Parasitic absorbance in the physically mixed regions between silver metal electrical contacts and electron transport layers (ETLs) near the back contact and a physical mixture of commercial indium tin oxide and hole transport layers (HTL) near the front electrical contact lead to substantial optical loss. A lower-density void + perovskite nucleation layer formed during perovskite deposition at the interface between the perovskite absorber layer and the HTL causes electronic losses because of incomplete collection of photogenerated carriers likely originating from poor coverage and passivation of the initially nucleating grains.
Identifiants
pubmed: 33470116
doi: 10.1021/acsami.0c16364
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM