Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images.

Deep learning Denoising STEM images Unsupervised learning

Journal

Applied microscopy
ISSN: 2287-4445
Titre abrégé: Appl Microsc
Pays: Korea (South)
ID NLM: 101698575

Informations de publication

Date de publication:
20 Oct 2020
Historique:
received: 06 08 2020
accepted: 17 09 2020
entrez: 13 2 2021
pubmed: 14 2 2021
medline: 14 2 2021
Statut: epublish

Résumé

We propose an effective deep learning model to denoise scanning transmission electron microscopy (STEM) image series, named Noise2Atom, to map images from a source domain [Formula: see text] to a target domain [Formula: see text], where [Formula: see text] is for our noisy experimental dataset, and [Formula: see text] is for the desired clear atomic images. Noise2Atom uses two external networks to apply additional constraints from the domain knowledge. This model requires no signal prior, no noise model estimation, and no paired training images. The only assumption is that the inputs are acquired with identical experimental configurations. To evaluate the restoration performance of our model, as it is impossible to obtain ground truth for our experimental dataset, we propose consecutive structural similarity (CSS) for image quality assessment, based on the fact that the structures remain much the same as the previous frame(s) within small scan intervals. We demonstrate the superiority of our model by providing evaluation in terms of CSS and visual quality on different experimental datasets.

Identifiants

pubmed: 33580362
doi: 10.1186/s42649-020-00041-8
pii: 10.1186/s42649-020-00041-8
pmc: PMC7818366
doi:

Types de publication

Journal Article

Langues

eng

Pagination

23

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Auteurs

Feng Wang (F)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, Dübendorf, CH-8600, Switzerland. Feng.Wang@empa.ch.

Trond R Henninen (TR)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, Dübendorf, CH-8600, Switzerland.

Debora Keller (D)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, Dübendorf, CH-8600, Switzerland.

Rolf Erni (R)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstr. 129, Dübendorf, CH-8600, Switzerland.

Classifications MeSH