Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films.

MOFs Seebeck coefficient charge transport conductivity thin films

Journal

Journal of physics. Condensed matter : an Institute of Physics journal
ISSN: 1361-648X
Titre abrégé: J Phys Condens Matter
Pays: England
ID NLM: 101165248

Informations de publication

Date de publication:
09 Aug 2022
Historique:
received: 01 08 2020
accepted: 17 02 2021
pubmed: 18 2 2021
medline: 18 2 2021
entrez: 17 2 2021
Statut: epublish

Résumé

This investigation on metal-organic framework (MOF) HUKUST-1 films focuses on comparing the undoped pristine state and with the case of doping by TCNQ infiltration of the MOF pore structure. We have determined the temperature dependent charge transport and

Identifiants

pubmed: 33596560
doi: 10.1088/1361-648X/abe72f
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

Creative Commons Attribution license.

Auteurs

Xin Chen (X)

Dept. Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, United States of America.

Kai Zhang (K)

Dept. Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, United States of America.
Applied Research Center, Newport News, Thomas Jefferson National Accelerator Lab, Virginia 23606, United States of America.

Zeinab Mohamed Hassan (ZM)

Institute of Functional Interfaces (IFG), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany.

Engelbert Redel (E)

Institute of Functional Interfaces (IFG), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany.

Helmut Baumgart (H)

Dept. Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, United States of America.
Applied Research Center, Newport News, Thomas Jefferson National Accelerator Lab, Virginia 23606, United States of America.

Classifications MeSH