A review on factors that affect surface charge accumulation and charge-induced surface flashover.

insulators of GIL/GIS surface charge accumulation surface flashover

Journal

Nanotechnology
ISSN: 1361-6528
Titre abrégé: Nanotechnology
Pays: England
ID NLM: 101241272

Informations de publication

Date de publication:
06 Apr 2021
Historique:
received: 31 07 2020
accepted: 25 02 2021
pubmed: 26 2 2021
medline: 26 2 2021
entrez: 25 2 2021
Statut: epublish

Résumé

The surface charge accumulation is very likely to trigger the surface flashover, which limits the large-scale application of DC GIL/GIS. This article comprehensively reviews the effect of six factors, including insulator-electrode shape, surface roughness of the insulator and conductor, metal particles, temperature, humidity, and gas type, on the insulator surface charging property. Furthermore, three models i.e. 'analogous ineffective region' expansion model, charge cluster triggered surface flashover model, and synergistic model of adsorbed gas, revealing the mechanism of charge triggered surface flashover phenomenon are reviewed and discussed. Future work from the perspective of theoretical analysis and engineering application are suggested in this field.

Identifiants

pubmed: 33631724
doi: 10.1088/1361-6528/abe9e3
doi:

Types de publication

Journal Article Review

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

© 2021 IOP Publishing Ltd.

Auteurs

Mengqiang Yuan (M)

School of Electrical Engineering, Shandong University, Jingshi Road #17923, Jinan,250014, People's Republic of China.

Liang Zou (L)

School of Electrical Engineering, Shandong University, Jingshi Road #17923, Jinan,250014, People's Republic of China.

Zongze Li (Z)

Electrical and Computer Engineering, University of Connecticut, Storrs, CT 06269, United States of America.

Long Pang (L)

School of Electrical Engineering, Shandong University, Jingshi Road #17923, Jinan,250014, People's Republic of China.

Tong Zhao (T)

School of Electrical Engineering, Shandong University, Jingshi Road #17923, Jinan,250014, People's Republic of China.

Li Zhang (L)

School of Electrical Engineering, Shandong University, Jingshi Road #17923, Jinan,250014, People's Republic of China.

Jierui Zhou (J)

Electrical and Computer Engineering, University of Connecticut, Storrs, CT 06269, United States of America.

Peng Xiao (P)

Computer Science and Engineering, University of Connecticut, Storrs, CT 06269, United States of America.

Shakeel Akram (S)

Institut d'Electronique et des Systèmes, University of Montpellier, Montpellier, France.

Zezhong Wang (Z)

State Grid Jibei Electric Economic Research Institute, Beijing, People's Republic of China.

Shun He (S)

Electric Power Research Institute, Yunnan Electric Power Grid Co., Ltd.Kunming, Yunnan, 650217, People's Republic of China.

Classifications MeSH