Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study.


Journal

Analytical chemistry
ISSN: 1520-6882
Titre abrégé: Anal Chem
Pays: United States
ID NLM: 0370536

Informations de publication

Date de publication:
09 03 2021
Historique:
pubmed: 27 2 2021
medline: 27 2 2021
entrez: 26 2 2021
Statut: ppublish

Résumé

We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the identification of peptide sample TOF-SIMS spectra by machine learning. More than 1000 time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of six peptide model samples (one of them was a test sample) were collected using 27 TOF-SIMS instruments from 25 institutes of six countries, the U. S., the U. K., Germany, China, South Korea, and Japan. Because peptides have systematic and simple chemical structures, they were selected as model samples. The intensity of peaks in every TOF-SIMS spectrum was extracted using the same peak list and normalized to the total ion count. The spectra of the test peptide sample were predicted by Random Forest with 20 amino acid labels. The accuracy of the prediction for the test spectra was 0.88. Although the prediction of an unknown peptide was not perfect, it was shown that all of the amino acids in an unknown peptide can be determined by Random Forest prediction and the TOF-SIMS spectra. Moreover, the prediction of peptides, which are included in the training spectra, was almost perfect. Random Forest also suggests specific fragment ions from an amino acid residue Q, whose fragment ions detected by TOF-SIMS have not been reported, in the important features. This study indicated that the analysis using Random Forest, which enables translation of the mathematical relationships to chemical relationships, and the multi labels representing monomer chemical structures, is useful to predict the TOF-SIMS spectra of an unknown peptide.

Identifiants

pubmed: 33635050
doi: 10.1021/acs.analchem.0c04577
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

4191-4197

Auteurs

Satoka Aoyagi (S)

Faculty of Science and Technology, Seikei University, Musashino, Tokyo 180-8633, Japan.

Yukio Fujiwara (Y)

National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan.

Akio Takano (A)

Toyama Co., Ltd., 3816-1 Kishi, Yamakita-machi, Ashigarakami-gun, Kanagawa 258-0112, Japan.

Jean-Luc Vorng (JL)

National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, UK.

Ian S Gilmore (IS)

National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, UK.

Yung-Chen Wang (YC)

Medtronic, Corporate Science & Technology, 710 Medtronic Parkway, Mailstop LT240, Minneapolis Minnesota 55432, United States.

Elke Tallarek (E)

Tascon GmbH, Mendelstr. 17, Münster 48149, Germany.

Birgit Hagenhoff (B)

Tascon GmbH, Mendelstr. 17, Münster 48149, Germany.

Shin-Ichi Iida (SI)

ULVAC-PHI, Inc., 2500 Hagisono, Chigasaki, Kanagawa 253-8522, Japan.

Andreas Luch (A)

Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR), Max-Dohrn-Strasse 8-10, Berlin 10589, Germany.

Harald Jungnickel (H)

Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR), Max-Dohrn-Strasse 8-10, Berlin 10589, Germany.

Yusheng Lang (Y)

Analytical Science Team, Common Base Technology Division, Innovative Technology Laboratories, AGC Inc., 1150 Hazawa-cho, Kanagawa-ku, Yokohama-shi, Kanagawa 221-8755, Japan.

Hyun Kyong Shon (HK)

Bio-imaging Team, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, South Korea.

Tae Geol Lee (TG)

Bio-imaging Team, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, South Korea.

Zhanping Li (Z)

Department of Chemistry, Tsinghua University, No. 30, Shuangqing Road, Haidian District, Beijing 100084, China.

Kazuhiro Matsuda (K)

Faculty of Science and Technology, Seikei University, Musashino, Tokyo 180-8633, Japan.
Surface Science Laboratories, Toray Research Center, Inc., 3-3-7, Sonoyama, Otsu, Shiga 520-8567, Japan.

Ichiro Mihara (I)

Analytical Technology and Solutions Laboratory, Kurashiki Research Center, KURARAY CO., LTD, 2045-1, Sakazu, Kurashiki, Okayama 710-0801, Japan.

Ako Miisho (A)

KOBELCO RESEARCH INSTITUTE, INC., 1-5-5, Takatsukadai, Nishi-ku, Kobe, Hyogo 651-2271, Japan.

Yohei Murayama (Y)

Specialty Chemicals Development Center, Peripheral Products Operations, Canon Inc., 4202, Fukara, Susono, Shizuoka 410-1196, Japan.

Takaharu Nagatomi (T)

Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan.

Reiko Ikeda (R)

Analytical Science Research Laboratory, Kao Corp., Minato 1334. Wakayama-shi, Wakayama 640-8580, Japan.

Masayuki Okamoto (M)

Analytical Science Research Laboratory, Kao Corp., Minato 1334. Wakayama-shi, Wakayama 640-8580, Japan.

Kunio Saiga (K)

Mitsui Chemical Analysis & Consulting Service Inc., 580-32 Nagaura, Sodegaura, Chiba 299-0265, Japan.

Toshihiko Tsuchiya (T)

Mitsui Chemical Analysis & Consulting Service Inc., 580-32 Nagaura, Sodegaura, Chiba 299-0265, Japan.

Shigeaki Uemura (S)

Sumitomo Electric Industries, Ltd., 1-1-1, Koyakita, Itami, Hyogo 664-0016, Japan.

Classifications MeSH