Atomic Insights into Ti Doping on the Stability Enhancement of Truncated Octahedron LiMn

Li-ion batteries Ti doping cathode materials crystal planes truncated octahedral LiMn2O4

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
17 Feb 2021
Historique:
received: 19 01 2021
revised: 10 02 2021
accepted: 15 02 2021
entrez: 6 3 2021
pubmed: 7 3 2021
medline: 7 3 2021
Statut: epublish

Résumé

Ti-doped truncated octahedron LiTi

Identifiants

DOI: 10.3390/nano11020508 PMID: 33671361 PMC: PMC7922770
pubmed: 33671361
pii: nano11020508
doi: 10.3390/nano11020508
pmc: PMC7922770
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : National Natural Science Foundation of China
ID : Grant No. 61974042 and 11774092
Organisme : Shanghai Science and Technology Innovation Action Plan
ID : No.19JC1416700
Organisme : National Key Research and Development Program of China
ID : 2017YFA0303403

Références

ACS Appl Mater Interfaces. 2016 May 4;8(17):11108-21
pubmed: 27031889
Nano Lett. 2009 Mar;9(3):1045-51
pubmed: 19209916
Angew Chem Int Ed Engl. 2015 Jan 19;54(4):1153-8
pubmed: 25470462
Micron. 2006;37(5):426-32
pubmed: 16469500
J Am Chem Soc. 2019 Sep 11;141(36):14038-14042
pubmed: 31448603
ACS Appl Mater Interfaces. 2017 Oct 11;9(40):35463-35475
pubmed: 28933817
J Colloid Interface Sci. 2021 Mar;585:729-739
pubmed: 33121760
ACS Appl Mater Interfaces. 2018 Jan 10;10(1):550-559
pubmed: 29265811
Angew Chem Int Ed Engl. 2011 Mar 21;50(13):3053-7
pubmed: 21404397
Adv Mater. 2017 Dec;29(47):
pubmed: 29076229

Auteurs

Wangqiong Xu (W)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Hongkai Li (H)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Yonghui Zheng (Y)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Weibin Lei (W)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Zhenguo Wang (Z)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Yan Cheng (Y)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Ruijuan Qi (R)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Hui Peng (H)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Hechun Lin (H)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Fangyu Yue (F)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.

Rong Huang (R)

Key Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai 200062, China.
Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, Shanxi, China.

Classifications MeSH